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CMNF - Caractérisation In-Line
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AutoSE spectroscopic ellipsometer

It enables measurements of optical properties of films having thickness ranging from few nanometers to few microns, between 440 to 1000 nm. It allows rapid and automatic data acquisitions (few seconds). Mapping of optical properties can be easily achieved on samples up to 100 x 100 mm², using the XYZ mtorized stage. Spot sizes down to  25 µm x 25 µm can be selected for local investigation.

The sofware is controlled by DeltaPsi2 sofware

Equipement sur badgeuse BCM depuis le 27mai 2021

Tool name:
Ellipso AutoSE
Jobin Yvon


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